& Quality Management
calculation with FIDES 2009
methodology for assessing failure rates use physical and
technical parameters (hard parameters).
Apart from the technical approach, FIDES (and 217Plus) uses a so called
management approach, too, with a substantial amount of soft parameters
derived from audit questionnaires.
Many engineers have difficulties in acknowledging that this could be a
valid approach at all.
The following Ceramic Capacitor
example may give some insight:
- Class (-->temperature drift)
- Rated voltage
- termination type (polymer or other)
- CV (product of current and voltage)
questionnaires in order to assess all the required maturity levels. In
fact these questionnaires form the major part of the more than 300 page
- Maturity of the component
- Maturity of the component supplier
- Maturity of the production process
- Maturity of the final product where the component is built
- Maturity of ..........
From quality management perspective, and in contrast to the opinion of
many engineers, this is
definitely a valid approach, because it addresses
today's main causes of unreliability better than traditional technical
approaches. Reliability of today's electronic components has increased
dramatically over the last decades, and therefore it is questionable to
assign the root causes of component failures to weaknesses of the
components themselves, while in fact today's failures are rather caused
operator misunderstanding, interface problems, misuse,
noncompliance with operating procedures and specifications and the
methodology can be compared
with ISO 9001 methodology. ISO 9001 is a management standard about
process quality. Simply put: If the processes are compliant with ISO
requirements, then the product quality is assumed to be good.
similar: The better the processes, the less likely a component would
Apart from the
FIDES has yet another differentiator:
In addition to
environment type and
temperature, FIDES mission profile takes furthermore into account air
pollution, air salinity and RMS vibration.